Retardance Measurement Station

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$24,950.00

Key Features

KEY FEATURES
  • Retardance measurements in under 2 seconds with one-click
  • Highly Repeatable
  • Fast Axis Alignment Check
  • Automatic Dark and Bright Reference
  • User-friendly Software Interface
  • Reference Retarder Included
Meadowlark Optics’ Retardance Measurement Station, Model TB1000, is the first commercial product for high precision measurements of waveplates. Customer demand triggered the development of the TB1000. This turnkey, fully-enclosed system measures the retardance of multi-order waveplates and same-material compound zero-order waveplates (Sapphire, Magnesium Fluoride, and Quartz). The TB1000 is versatile and portable and can be easily moved from the R&D lab to the production floor, bringing the precision of Meadowlark Optics Metrology Services from our lab to yours. Retardance measurements are obtained in under 2 seconds with the userfriendly software in just one click.

Common Specifications

Retardation Range: 0.1 – 45 waves at 630 nm (default)
Wavelength measurement range capabilities: 380 nm to 4.5 µm
Maximum optic size (to center): 8.2” (208 mm)
Retardance Accuracy: 0.005 waves at 630 nm
Measurement Rate: < 2 seconds

Measurement Spot Diameter: 3.8 mm
Measurement Units: nm, λ (for retardance), or mm (for thickness)
Crystal Types: Quartz,  Sapphire, Magnesium fluoride
Interface: USB 2.0

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Retardance Measurement Station
TB1000
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Proprietary Software
Reference Retarder
1-2 Weeks

Retardance Measurement Station

A reference retarder is included with each shipment to ensure the system is meeting the calibration as measured at the factory prior to shipping. Optional items can be added to the TB1000. The standard system has alignment marks to assist in placement of the waveplate on the measurement bay. This area can be customized per the user’s crystal dimensions with our drop-in alignment guide, which ensures that measurements are spatially accurate each and every time.

The TB1000 software is fully automated and provides user’s retardance measurements with a simple click. It only takes <2 seconds to obtain accurate, repeatable results. Due to variation in crystal structure, calculating the retardance based on the thickness of the material using only a listed birefringence can lead to errors. The TB1000 allows an end user to accurately measure the real retardance of each waveplate.

Retardance in crystals will change with temperature variation. As a rule of thumb, the retardance (in waves) for a 1 mm thick quartz retarder varies by about – 0.5 % per °C. For this reason, we encourage regular monitoring of air temperature around the equipment if small retardance changes are concerning. Alternatively, you can use the reference retarder included with the TB1000 to confirm accurate readings.

Specifications

   Retardation Range    0.1 – 45 waves at 630 nm (default)
   Wavelength measurement range capabilities    380 nm to 4.5 µm
   Maximum optic size (to center)    8.2” (208 mm)
   Retardance Accuracy¹    0.005 waves at 630 nm
   Measurement Rate²    < 2 seconds
   Measurement Spot Diameter    3.8 mm
   Measurement Units     nm, λ (for retardance), or mm (for thickness)
   Crystal Types    Quartz
   Sapphire
   Magnesium fluoride
   Interface     USB 2.0
TB1000 Retardance Measurement Station Exterior Dimensions
TB1000 Retardance Measurement Station Exterior Dimensions

Sample Measurements using TB1000

Material

Measured Thickness in mm¹

Calculated Retardance in nm (waves)²

Measured Retardance in nm (waves)³

Quartz A

3.068

27,770 (43.870)

27,705 (43.768)

Quartz B

1.623

14,691 (23.208)

14,648 (23.142)

Quartz C

0.198

1,792 (2.830)

1,753 (2.771)

Sapphire A

1.733

13,976 (22.079)

13,958 (22.052)

Sapphire B

3.475

28,018 (44.262)

27,984 (44.210)

MgF2 A

2.320

27,300 (43.127)

27,184 (42.945)

MgF2 B

0.483

5,789 (9.145)

5,667 (8.953)

  1. Measured on Heidenhain length gauge.
  2. Retardance calculated using δ = ßt/λ, using Measured Thickness
  3. Measured at 633nm on TB1000.

Ordering Information – Contact Us or Buy Online

ORDERING INFORMATION

Item

Part Number

Retardance Measuring Station

TB1000

Optional Sample Holder Kit

TB1000-SHK

Polarizer Selection Guide

Meadowlark Polarizers are available in circular, linear, and beam splitting types. Standard models are designed for either broad or specific wavelength capabilities, for use in the 220-nm to 6-micron range, and custom options extend up to 15 microns. Meadowlark Optics delivers high quality and precision, featuring excellent surface quality, high extinction ratio, and low transmitted wavefront distortion. Additionally, we provide custom solutions such as prism clusters, attached retarders, and various shapes and sizes, ensuring tailored components that fit your specific needs.

 

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