Waveplate Retardance Metrology: The Basics and Beyond
Waveplate Retardance Metrology: The Basics and Beyond INTRODUCTIONWaveplates are important
Key Features
Retardation Range: 0.1 – 45 waves at 630 nm (default)
Wavelength measurement range capabilities: 380 nm to 4.5 µm
Maximum optic size (to center): 8.2” (208 mm)
Retardance Accuracy: 0.005 waves at 630 nm
Measurement Rate: < 2 seconds
Measurement Spot Diameter: 3.8 mm
Measurement Units: nm, λ (for retardance), or mm (for thickness)
Crystal Types: Quartz, Sapphire, Magnesium fluoride
Interface: USB 2.0
Name | Item # | Features | Lead Time | Purchase |
---|---|---|---|---|
Retardance Measurement Station | TB1000 | Fast Axis ⋅ Proprietary Software ⋅ Reference Retarder | 1-2 Weeks |
A reference retarder is included with each shipment to ensure the system is meeting the calibration as measured at the factory prior to shipping. Optional items can be added to the TB1000. The standard system has alignment marks to assist in placement of the waveplate on the measurement bay. This area can be customized per the user’s crystal dimensions with our drop-in alignment guide, which ensures that measurements are spatially accurate each and every time.
The TB1000 software is fully automated and provides user’s retardance measurements with a simple click. It only takes <2 seconds to obtain accurate, repeatable results. Due to variation in crystal structure, calculating the retardance based on the thickness of the material using only a listed birefringence can lead to errors. The TB1000 allows an end user to accurately measure the real retardance of each waveplate.
Retardance in crystals will change with temperature variation. As a rule of thumb, the retardance (in waves) for a 1 mm thick quartz retarder varies by about – 0.5 % per °C. For this reason, we encourage regular monitoring of air temperature around the equipment if small retardance changes are concerning. Alternatively, you can use the reference retarder included with the TB1000 to confirm accurate readings.
Retardation Range | 0.1 – 45 waves at 630 nm (default) |
Wavelength measurement range capabilities | 380 nm to 4.5 µm |
Maximum optic size (to center) | 8.2” (208 mm) |
Retardance Accuracy¹ | 0.005 waves at 630 nm |
Measurement Rate² | < 2 seconds |
Measurement Spot Diameter | 3.8 mm |
Measurement Units | nm, λ (for retardance), or mm (for thickness) |
Crystal Types | Quartz Sapphire Magnesium fluoride |
Interface | USB 2.0 |
Material | Measured Thickness in mm¹ | Calculated Retardance in nm (waves)² | Measured Retardance in nm (waves)³ |
Quartz A | 3.068 | 27,770 (43.870) | 27,705 (43.768) |
Quartz B | 1.623 | 14,691 (23.208) | 14,648 (23.142) |
Quartz C | 0.198 | 1,792 (2.830) | 1,753 (2.771) |
Sapphire A | 1.733 | 13,976 (22.079) | 13,958 (22.052) |
Sapphire B | 3.475 | 28,018 (44.262) | 27,984 (44.210) |
MgF2 A | 2.320 | 27,300 (43.127) | 27,184 (42.945) |
MgF2 B | 0.483 | 5,789 (9.145) | 5,667 (8.953) |
ORDERING INFORMATION | |
Item | Part Number |
Retardance Measuring Station | TB1000 |
Optional Sample Holder Kit | TB1000-SHK |
Meadowlark Polarizers are available in circular, linear, and beam splitting types. Standard models are designed for either broad or specific wavelength capabilities, for use in the 220-nm to 6-micron range, and custom options extend up to 15 microns. Meadowlark Optics delivers high quality and precision, featuring excellent surface quality, high extinction ratio, and low transmitted wavefront distortion. Additionally, we provide custom solutions such as prism clusters, attached retarders, and various shapes and sizes, ensuring tailored components that fit your specific needs.
Waveplate Retardance Metrology: The Basics and Beyond INTRODUCTIONWaveplates are important